Manufacturing Operations Management

Factova SPC

A statistical process control system for CTQ management

WHY

Why Is It Needed?

Most defects that occur lead to scrapping or rework, which translates directly into cost losses. A quality management framework is therefore needed that goes beyond simple pass/fail judgment to statistically manage CTQ measurements (thickness, strength, etc.) and respond before they become defects.

Factova SPC collects inspection data in real time from inspection and measurement equipment, without separate site visits or data processing, and quickly detects signs of abnormality so action can be taken in time.

WHERE

Where Is It Used?

Target industries: semiconductors/displays, medical devices, batteries, chemicals/materials, etc.
Any manufacturing industry that needs mid-process quality inspection, whether because precision processes turn even small deviations into defects or because high manufacturing costs make defects expensive
Target Customers
Companies moving from inspection-centered QC to a data-based process control framework Production/quality organizations that need cost reduction through lower defect rates and improved yield
KEY CAPABILITIES

4 Key Points of Factova SPC

01 Inspection and Measurement Data Collection
Standardization and consistency validation of inspection/measurement equipment data
02 Real-Time Abnormality Detection
Rule-based real-time abnormality detection using SPC statistical techniques
03 Process Control
Process control through automatic control limit revision and process capability indices
04 Related System Integration and Interlock
For critical abnormalities, interlock the causing equipment/product, integrate with related systems, and act according to the action plan
DETECT · ANALYZE · ACT

Factova SPC + FDC + OCAP

Factova links FDC, SPC, and OCAP to provide an end-to-end process management environment, from anomaly detection (Detect) and root-cause analysis (Analyze) to response execution (Act).

Process Anomaly Detection
SPC · Inspection and Metrology CTQ anomaly detection, defect anomaly detection
FDC · Equipment CTP anomaly detection, CTE anomaly detection
→
Anomaly Notification
OCAP Process Anomaly Intake Anomaly Response Procedure Guide Action Execution Integration
→
Process Event and Status Delivery
MES Anomaly Action Execution Action Status Update Anomaly Cleared
AI Assistant Built In
SPC AI Assistant Natural-language queries provide control chart analysis, process capability evaluation, term explanations, and process status summaries for a given period, helping you understand data intuitively.
Super Agent Integrates with SPC and FDC manuals, OCAP, and MES to enable root-cause analysis based on diverse data such as recipe change history, equipment events, and lot history.
IMPACT

Benefits

Actual Impact of SPC, FDC, and OCAP
Finished product defect rate
60% Reduced
Actual Impact of SPC, FDC, and OCAP
New plant yield
90% Achieved
Actual Impact of SPC, FDC, and OCAP
Real-time inventory accuracy
90% improvement
Actual Impact of SPC, FDC, and OCAP
Scrap rate
30% Reduced
Actual Impact of SPC, FDC, and OCAP
Abnormality detection time
Before At least tens of minutes → After Real-time
99% Reduced
Actual Impact of SPC, FDC, and OCAP
End-to-End traceability
90% Achieved
Applied industries: displays, batteries, chemicals
CUSTOMER VOICE

Voice of the Customer

"Thanks to FDC's real-time anomaly detection, line stoppages are gone, and even chronic quality defects and delivery delays have been resolved."
Head of Production Operations, Display Manufacturer
WHY LG CNS

Why LG CNS

01 Data Consistency Management Framework

Integrates data from various equipment inspection/measurement devices based on standard communication specifications and secures data reliability and usability through consistency validation.

02 Integration with related systems

Interfaces with MES and OCAP to build an integrated environment that runs from interlock to follow-up action when a process abnormality occurs.

03 AI Assistant Available

Supports control chart and process capability analysis and summaries through the SPC AI Assistant.

REFERENCE

References

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